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"Deterministic identity testing of depth 4 multilinear circuits with ..."
Zohar Shay Karnin et al. (2009)
- Zohar Shay Karnin, Partha Mukhopadhyay, Amir Shpilka, Ilya Volkovich:
Deterministic identity testing of depth 4 multilinear circuits with bounded top fan-in. Electron. Colloquium Comput. Complex. TR09 (2009)
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