"An occurrence of multiple projections in DEA-based measurement of ..."

Toshiyuki Sueyoshi, Kazuyuki Sekitani (2009)

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DOI: 10.1016/J.EJOR.2008.01.045

access: closed

type: Journal Article

metadata version: 2020-02-21

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Toshiyuki Sueyoshi, Kazuyuki Sekitani:
An occurrence of multiple projections in DEA-based measurement of technical efficiency: Theoretical comparison among DEA models from desirable properties. Eur. J. Oper. Res. 196(2): 764-794 (2009)

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