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"On the use of calling structure information to improve fault prediction."
Yonghee Shin et al. (2012)
- Yonghee Shin, Robert M. Bell, Thomas J. Ostrand, Elaine J. Weyuker:
On the use of calling structure information to improve fault prediction. Empir. Softw. Eng. 17(4-5): 390-423 (2012)
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