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"An Abstract Fault Model for NAND Flash Memory."

JiHyuck Yun et al. (2012)

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DOI: 10.1109/LES.2012.2213235

access: closed

type: Journal Article

metadata version: 2020-09-10

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  dblp key:
  - journals/esl/YunYNM12
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  persistent URL:
  - https://dblp.org/rec/journals/esl/YunYNM12
JiHyuck Yun, Jinhyuk Yoon, Eyee Hyun Nam, Sang Lyul Min:
An Abstract Fault Model for NAND Flash Memory. IEEE Embed. Syst. Lett. 4(4): 86-89 (2012)

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