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"Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based ..."

Efi Arvaniti, Yiorgos Tsiatouhas (2014)

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DOI: 10.1007/S10836-014-5453-9

access: closed

type: Journal Article

metadata version: 2020-09-11

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Efi Arvaniti, Yiorgos Tsiatouhas:
Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique. J. Electron. Test. 30(3): 329-341 (2014)

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