"Built-In Self-Test of Field Programmable Analog Arrays based on Transient ..."

Tiago R. Balen et al. (2007)

> Home

Details and statistics

DOI: 10.1007/S10836-007-5004-8

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/BalenCLR07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/BalenCLR07
Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electron. Test. 23(6): 497-512 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.