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"A Method for Trading off Test Time, Area and Fault Coverage in Datapath ..."

David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre (2001)

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DOI: 10.1023/A:1012227715327

access: closed

type: Journal Article

metadata version: 2020-09-11

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David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre:
A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST Synthesis. J. Electron. Test. 17(3-4): 331-339 (2001)

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