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"Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the ..."
Shuo Cai et al. (2020)
- Shuo Cai, Binyong He, Weizheng Wang, Peng Liu, Fei Yu, Lairong Yin, Bo Li:
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults. J. Electron. Test. 36(4): 469-483 (2020)
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