"Structural Fault Based Specification Reduction for Testing Analog Circuits."

Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen (2002)

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DOI: 10.1023/A:1020892721493

access: closed

type: Journal Article

metadata version: 2023-03-07

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Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen:
Structural Fault Based Specification Reduction for Testing Analog Circuits. J. Electron. Test. 18(6): 571-581 (2002)

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