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"A Built-In Redundancy-Analysis Scheme for Random Access Memories with ..."

Da-Ming Chang, Jin-Fu Li, Yu-Jen Huang (2008)

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DOI: 10.1007/S10836-007-5032-4

access: closed

type: Journal Article

metadata version: 2023-10-17

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Da-Ming Chang, Jin-Fu Li, Yu-Jen Huang:
A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy. J. Electron. Test. 24(1-3): 181-192 (2008)

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