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ORCID"MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs."
Sunghoon Chun, YongJoon Kim, Sungho Kang (2007)
- Sunghoon Chun, YongJoon Kim, Sungho Kang:
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. J. Electron. Test. 23(4): 357-362 (2007)
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