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"One More Class of Sequential Circuits having Combinational Test Generation ..."

Debesh Kumar Das, Hideo Fujiwara (2015)

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DOI: 10.1007/S10836-015-5527-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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Debesh Kumar Das, Hideo Fujiwara:
One More Class of Sequential Circuits having Combinational Test Generation Complexity. J. Electron. Test. 31(3): 321-327 (2015)

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