"Classification and Test Generation for Path-Delay Faults Using Single ..."

Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal (1997)

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DOI: 10.1023/A:1008247801050

access: closed

type: Journal Article

metadata version: 2020-09-11

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Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal:
Classification and Test Generation for Path-Delay Faults Using Single Struck-at Fault Tests. J. Electron. Test. 11(1): 55-67 (1997)

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