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"Partial scan design and test sequence generation based on reduced scan ..."

Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita (1995)

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DOI: 10.1007/BF00993319

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita:
Partial scan design and test sequence generation based on reduced scan shift method. J. Electron. Test. 7(1-2): 115-124 (1995)

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