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"A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement."

Hyunjin Kim, Jacob A. Abraham (2012)

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DOI: 10.1007/S10836-012-5324-1

access: closed

type: Journal Article

metadata version: 2020-09-11

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Hyunjin Kim, Jacob A. Abraham:
A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement. J. Electron. Test. 28(5): 585-597 (2012)

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