"Partial scan flip-flop selection by use of empirical testability."

Kee Sup Kim, Charles R. Kime (1995)

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DOI: 10.1007/BF00993313

access: closed

type: Journal Article

metadata version: 2020-09-11

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Kee Sup Kim, Charles R. Kime:
Partial scan flip-flop selection by use of empirical testability. J. Electron. Test. 7(1-2): 47-59 (1995)

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