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"Design of CMOS checkers with improved testability of bridging and ..."

Cecilia Metra et al. (1995)

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DOI: 10.1007/BF00993127

access: closed

type: Journal Article

metadata version: 2020-09-11

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Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults. J. Electron. Test. 6(1): 7-22 (1995)

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