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"Static Test Compaction for Scan-Based Designs to Reduce Test Application Time."

Irith Pomeranz, Sudhakar M. Reddy (2000)

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DOI: 10.1023/A:1008385125818

access: closed

type: Journal Article

metadata version: 2020-09-11

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Irith Pomeranz, Sudhakar M. Reddy:
Static Test Compaction for Scan-Based Designs to Reduce Test Application Time. J. Electron. Test. 16(5): 541-552 (2000)

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