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"RTL-Based Functional Test Generation for High Defects Coverage in Digital ..."

Marcelino B. Santos et al. (2001)

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DOI: 10.1023/A:1012223614418

access: closed

type: Journal Article

metadata version: 2022-09-30

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Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. J. Electron. Test. 17(3-4): 311-319 (2001)

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