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"Spectral Prediction for Specification-Based Loopback Test of Embedded ..."

Hongjoong Shin, Joonsung Park, Jacob A. Abraham (2010)

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DOI: 10.1007/S10836-009-5136-0

access: closed

type: Journal Article

metadata version: 2020-09-11

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Hongjoong Shin, Joonsung Park, Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. J. Electron. Test. 26(1): 73-86 (2010)

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