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"A Test Generation Method of R-2R Digital-to-Analog Converters Based on ..."

Xiaoyan Yang, Chenglin Yang, Houjun Wang (2021)

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DOI: 10.1007/S10836-021-05974-W

access: closed

type: Journal Article

metadata version: 2022-02-23

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Xiaoyan Yang, Chenglin Yang, Houjun Wang:
A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm. J. Electron. Test. 37(5): 701-713 (2021)

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