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"One scan based high average-utility pattern mining in static and dynamic ..."

Jongseong Kim et al. (2020)

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DOI: 10.1016/J.FUTURE.2020.04.027

access: closed

type: Journal Article

metadata version: 2022-06-23

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Jongseong Kim, Unil Yun, Eunchul Yoon, Jerry Chun-Wei Lin, Philippe Fournier-Viger:
One scan based high average-utility pattern mining in static and dynamic databases. Future Gener. Comput. Syst. 111: 143-158 (2020)

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