Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Detecting Faults in Inner Product Masking Scheme - IPM-FD: IPM with Fault ..."

Wei Cheng et al. (2019)

> Home

Details and statistics

DOI: —

access: open

type: Informal or Other Publication

metadata version: 2022-03-11

- view
  - electronic edition @ iacr.org (open access)
- export record
  dblp key:
  - journals/iacr/ChengCGGD19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/iacr/ChengCGGD19
Wei Cheng, Claude Carlet, Kouassi Goli, Sylvain Guilley, Jean-Luc Danger:
Detecting Faults in Inner Product Masking Scheme - IPM-FD: IPM with Fault Detection. IACR Cryptol. ePrint Arch. 2019: 919 (2019)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.