Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Head reliability of AMR sensors based on thermal stress tests."

Icko Eric Timothy Iben (2003)

> Home

Details and statistics

DOI: 10.1147/RD.474.0415

access: closed

type: Journal Article

metadata version: 2020-03-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ibmrd/Iben03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ibmrd/Iben03
Icko Eric Timothy Iben:
Head reliability of AMR sensors based on thermal stress tests. IBM J. Res. Dev. 47(4): 415-428 (2003)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.