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ORCID"Analysis and modeling for MOSFET degradation under RF stress."
Haipeng Fu et al. (2021)
- Haipeng Fu, Liping Yang, Muqian Niu, Xuguang Li, Kaixue Ma:
Analysis and modeling for MOSFET degradation under RF stress. IEICE Electron. Express 18(8): 20210116 (2021)
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