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"Real array pattern tolerances from amplitude excitation errors."

Toshifumi Moriyama et al. (2014)

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DOI: 10.1587/ELEX.11.20140571

access: open

type: Journal Article

metadata version: 2022-04-09

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  dblp key:
  - journals/ieiceee/MoriyamaPASR14
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  - https://dblp.org/rec/journals/ieiceee/MoriyamaPASR14
Toshifumi Moriyama, Lorenzo Poli, Nicola Anselmi, Marco Salucci, Paolo Rocca:
Real array pattern tolerances from amplitude excitation errors. IEICE Electron. Express 11(17): 20140571 (2014)

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