"A scan disabling-based BAST scheme for test cost and test power reduction."

Zhiqiang You et al. (2012)

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DOI: 10.1587/ELEX.9.111

access: open

type: Journal Article

metadata version: 2025-02-27

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  - https://dblp.org/rec/journals/ieiceee/YouWLKQ12
Zhiqiang You, Weizheng Wang, Peng Liu, Jishun Kuang, Zheng Qin:
A scan disabling-based BAST scheme for test cost and test power reduction. IEICE Electron. Express 9(2): 111-116 (2012)

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