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"Modeling of Triangular Sacrificial Layer Residue Effect in ..."

Woo Young Choi et al. (2013)

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DOI: 10.1587/TRANSELE.E96.C.714

access: closed

type: Journal Article

metadata version: 2020-06-15

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  - journals/ieicet/ChoiHHSC13
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/ChoiHHSC13
Woo Young Choi, Min Su Han, Boram Han, Dongsun Seo, Il Hwan Cho:
Modeling of Triangular Sacrificial Layer Residue Effect in Nano-Electro-Mechanical Nonvolatile Memory. IEICE Trans. Electron. 96-C(5): 714-717 (2013)

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