"A Low Capture Power Test Generation Method Based on Capture Safe Test ..."

Toshinori Hosokawa et al. (2017)

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DOI: 10.1587/TRANSINF.2016EDP7418

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/HosokawaHYA17
Toshinori Hosokawa, Atsushi Hirai, Yukari Yamauchi, Masayuki Arai:
A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation. IEICE Trans. Inf. Syst. 100-D(9): 2118-2125 (2017)

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