"A Fault Dependent Test Generation Method for State-Observable FSMs to ..."

Ryoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara (2010)

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DOI: 10.1587/TRANSINF.E93.D.24

access: closed

type: Journal Article

metadata version: 2020-04-11

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Ryoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara:
A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint. IEICE Trans. Inf. Syst. 93-D(1): 24-32 (2010)

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