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"RFCV Test Structure Design for a Selected Frequency Range."

Wutthinan Jeamsaksiri et al. (2005)

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DOI: 10.1093/IETELE/E88-C.5.817

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - journals/ieicet/JeamsaksiriMRDC05
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  - https://dblp.org/rec/journals/ieicet/JeamsaksiriMRDC05
Wutthinan Jeamsaksiri, Abdelkarim Mercha, Javier Ramos, Stefaan Decoutere, Florence Cubaynes:
RFCV Test Structure Design for a Selected Frequency Range. IEICE Trans. Electron. 88-C(5): 817-823 (2005)

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