"Verification of Stable Circuit Operation of 180 nm Current Controlled MOS ..."

Masashi Kamiyanagi et al. (2011)

Details and statistics

DOI: 10.1587/TRANSELE.E94.C.760

access: closed

type: Journal Article

metadata version: 2020-04-11

a service of  Schloss Dagstuhl - Leibniz Center for Informatics