Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A New Low Power Test Pattern Generator for BIST Architecture."

Kicheol Kim et al. (2005)

> Home

Details and statistics

DOI: 10.1093/IETELE/E88-C.10.2037

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ieicet/KimSKK05a
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/KimSKK05a
Kicheol Kim, DongSub Song, Incheol Kim, Sungho Kang:
A New Low Power Test Pattern Generator for BIST Architecture. IEICE Trans. Electron. 88-C(10): 2037-2038 (2005)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.