"Parasitic Effects in Multi-Gate MOSFETs."

Yusuke Kobayashi et al. (2007)

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DOI: 10.1093/IETELE/E90-C.10.2051

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type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/KobayashiMTHKRAI07
Yusuke Kobayashi, C. Raghunathan Manoj, Kazuo Tsutsui, Venkanarayan Hariharan, Kuniyuki Kakushima, V. Ramgopal Rao, Parhat Ahmet, Hiroshi Iwai:
Parasitic Effects in Multi-Gate MOSFETs. IEICE Trans. Electron. 90-C(10): 2051-2056 (2007)

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