"Estimation of Nb Junction Temperature Raised Due to Thermal Heat from Bias ..."

Keisuke Kuroiwa et al. (2012)

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DOI: 10.1587/TRANSELE.E95.C.355

access: closed

type: Journal Article

metadata version: 2020-10-26

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Keisuke Kuroiwa, Masaki Kadowaki, Masataka Moriya, Hiroshi Shimada, Yoshinao Mizugaki:
Estimation of Nb Junction Temperature Raised Due to Thermal Heat from Bias Resistor. IEICE Trans. Electron. 95-C(3): 355-359 (2012)

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