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"Analysis of Phase Noise Degradation Considering Switch Transistor ..."

Rui Murakami et al. (2010)

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DOI: 10.1587/TRANSELE.E93.C.777

access: closed

type: Journal Article

metadata version: 2020-04-11

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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/MurakamiHOM10
Rui Murakami, Shoichi Hara, Kenichi Okada, Akira Matsuzawa:
Analysis of Phase Noise Degradation Considering Switch Transistor Capacitances for CMOS Voltage Controlled Oscillators. IEICE Trans. Electron. 93-C(6): 777-784 (2010)

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