"Characterization of Mg Diffusion into ..."

Akio Ohta et al. (2011)

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DOI: 10.1587/TRANSELE.E94.C.717

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type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/OhtaKMHM11
Akio Ohta, Daisuke Kanme, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Characterization of Mg Diffusion into HfO₂/SiO₂/Si(100) Stacked Structures and Its Impact on Detect State Densities. IEICE Trans. Electron. 94-C(5): 717-723 (2011)

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