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"An Area-Efficient, Low-VDD, Highly Reliable Multi-Cell Antifuse System ..."

Jong-Pil Son et al. (2011)

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DOI: 10.1587/TRANSELE.E94.C.1690

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
  - journals/ieicet/SonKAHYMPHJCJK11
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/SonKAHYMPHJCJK11
Jong-Pil Son, Jin Ho Kim, Woo Song Ahn, Seung Uk Han, Satoru Yamada, Byung-Sick Moon, Churoo Park, Hong-Sun Hwang, Seong-Jin Jang, Joo-Sun Choi, Young-Hyun Jun, Soo-Won Kim:
An Area-Efficient, Low-VDD, Highly Reliable Multi-Cell Antifuse System Fully Operative in DRAMs. IEICE Trans. Electron. 94-C(10): 1690-1697 (2011)

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