"Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using ..."

Hiroyuki Yotsuyanagi, Masayuki Yamamoto, Masaki Hashizume (2010)

Details and statistics

DOI: 10.1587/TRANSINF.E93.D.10

access: closed

type: Journal Article

metadata version: 2020-04-11

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