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"Test compaction methods for transition faults under transparent-scan."

Irith Pomeranz, Sudhakar M. Reddy (2009)

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DOI: 10.1049/IET-CDT.2008.0115

access: closed

type: Journal Article

metadata version: 2020-07-14

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  - https://dblp.org/rec/journals/iet-cdt/PomeranzR09c
Irith Pomeranz, Sudhakar M. Reddy:
Test compaction methods for transition faults under transparent-scan. IET Comput. Digit. Tech. 3(4): 315-328 (2009)

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