"Test scheduling for built-in self-tested embedded SRAMs with data ..."

Qiang Xu et al. (2007)

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DOI: 10.1049/IET-CDT:20060128

access: closed

type: Journal Article

metadata version: 2023-03-30

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Qiang Xu, Baosheng Wang, André Ivanov, Fung Yu Young:
Test scheduling for built-in self-tested embedded SRAMs with data retention faults. IET Comput. Digit. Tech. 1(3): 256-264 (2007)

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