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"A bipolar junction transistor EMC modeling method based on physical ..."

Zeyu Pan et al. (2024)

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DOI: 10.1002/CTA.3797

access: closed

type: Journal Article

metadata version: 2024-04-01

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Zeyu Pan, Yu Zhang, Dan Ren, Jinsheng Yang, Bao-Lin Nie, Pingan Du:
A bipolar junction transistor EMC modeling method based on physical characteristic measurement and simplex optimization. Int. J. Circuit Theory Appl. 52(2): 551-568 (2024)

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