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"Rapid fault cause identification in surface mount technology processes ..."

Dongil Kim et al. (2019)

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DOI: 10.1177/1550147719832802

access: open

type: Journal Article

metadata version: 2023-03-21

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Dongil Kim, Jeongin Koo, Hyein Kim, Seokho Kang, Sang-Hyun Lee, Jeong-Tae Kang:
Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis. Int. J. Distributed Sens. Networks 15(2) (2019)

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