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"Thermal Noise Measurement and Characterization for Modern Semiconductor ..."

Chih-Hung Chen (2021)

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DOI: 10.1109/MIM.2021.9400958

access: closed

type: Journal Article

metadata version: 2021-04-22

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Chih-Hung Chen:
Thermal Noise Measurement and Characterization for Modern Semiconductor Devices. IEEE Instrum. Meas. Mag. 24(2): 60-71 (2021)

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