"On the adoption of MC/DC and control-flow adequacy for a tight integration ..."

Bo Jiang et al. (2013)

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DOI: 10.1016/J.INFSOF.2012.10.001

access: closed

type: Journal Article

metadata version: 2020-02-20

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Bo Jiang, Ke Zhai, W. K. Chan, T. H. Tse, Zhenyu Zhang:
On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization. Inf. Softw. Technol. 55(5): 897-917 (2013)

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