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"MAESTRO: Automated test generation framework for high test coverage and ..."

Yunho Kim et al. (2020)

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DOI: 10.1016/J.INFSOF.2019.106221

access: closed

type: Journal Article

metadata version: 2022-08-16

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  - https://dblp.org/rec/journals/infsof/KimLBK20
Yunho Kim, Dongju Lee, Junki Baek, Moonzoo Kim:
MAESTRO: Automated test generation framework for high test coverage and reduced human effort in automotive industry. Inf. Softw. Technol. 123: 106221 (2020)

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