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"TLEL: A two-layer ensemble learning approach for just-in-time defect ..."

Xinli Yang et al. (2017)

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DOI: 10.1016/J.INFSOF.2017.03.007

access: closed

type: Journal Article

metadata version: 2022-08-16

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  - https://dblp.org/rec/journals/infsof/YangLXS17
Xinli Yang, David Lo, Xin Xia, Jianling Sun:
TLEL: A two-layer ensemble learning approach for just-in-time defect prediction. Inf. Softw. Technol. 87: 206-220 (2017)

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