"Zero-Bias Deep-Learning-Enabled Quickest Abnormal Event Detection in IoT."

Yongxin Liu et al. (2022)

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DOI: 10.1109/JIOT.2021.3126819

access: closed

type: Journal Article

metadata version: 2023-08-28

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Yongxin Liu, Jian Wang, Jianqiang Li, Shuteng Niu, Lei Wu, Houbing Song:
Zero-Bias Deep-Learning-Enabled Quickest Abnormal Event Detection in IoT. IEEE Internet Things J. 9(13): 11385-11395 (2022)

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