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"Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with ..."

Kentaroh Katoh, Kazuteru Namba, Hideo Ito (2008)

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DOI: 10.2197/IPSJTSLDM.1.91

access: closed

type: Journal Article

metadata version: 2020-09-29

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Kentaroh Katoh, Kazuteru Namba, Hideo Ito:
Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability. IPSJ Trans. Syst. LSI Des. Methodol. 1: 91-103 (2008)

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