"A chance for models to show their quality: Stochastic process model-log ..."

Adam T. Burke et al. (2024)

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DOI: 10.1016/J.IS.2024.102382

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type: Journal Article

metadata version: 2024-08-22

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Adam T. Burke, Sander J. J. Leemans, Moe Thandar Wynn, Wil M. P. van der Aalst, Arthur H. M. ter Hofstede:
A chance for models to show their quality: Stochastic process model-log dimensions. Inf. Syst. 124: 102382 (2024)

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