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"A chance for models to show their quality: Stochastic process model-log ..."
Adam T. Burke et al. (2024)
- Adam T. Burke
, Sander J. J. Leemans
, Moe Thandar Wynn
, Wil M. P. van der Aalst
, Arthur H. M. ter Hofstede
:
A chance for models to show their quality: Stochastic process model-log dimensions. Inf. Syst. 124: 102382 (2024)

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